High count rate electron probe microanalysis. Geller, J. D. & Herrington, C. Journal of research of the National Institute of Standards and Technology, 107(6):503, 2002.
Paper bibtex @article{geller_high_2002,
title = {High count rate electron probe microanalysis},
volume = {107},
url = {https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863843/},
number = {6},
urldate = {2017-09-06},
journal = {Journal of research of the National Institute of Standards and Technology},
author = {Geller, Joseph D. and Herrington, Charles},
year = {2002},
pages = {503},
}
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