Demonstration of Citation Pattern Analysis for Plagiarism Detection. Gipp, B., Meuschke, N., Breitinger, C., Lipinski, M., & Nuernberger, A. In Proceedings of the 36th International ACM SIGIR Conference on Research and Development in Information Retrieval, Dublin, UK, Jul. 28 - Aug. 1, 2013. ACM.
Demonstration of Citation Pattern Analysis for Plagiarism Detection [link]Paper  doi  bibtex   
@InProceedings{Gipp13,
  Title                    = {{D}emonstration of {C}itation {P}attern {A}nalysis for {P}lagiarism {D}etection},
  Author                   = {{G}ipp, {B}ela and {M}euschke, {N}orman and {B}reitinger, {C}orinna and {L}ipinski, {M}ario and {N}uernberger, {A}ndreas},
  Booktitle                = {{P}roceedings of the 36th {I}nternational {ACM} {SIGIR} {C}onference on {R}esearch and {D}evelopment in {I}nformation {R}etrieval},
  Year                     = {2013},
  Address                  = {Dublin, UK},
  Month                    = {Jul. 28 - Aug. 1},
  Publisher                = {ACM},
  Doi                      = {10.1145/2484028.2484214},
  Url                      = {https://dx.doi.org/10.1145/2484028.2484214},
  Topic                    = {pd}
}

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