@inproceedings{ dblp3906134,
  title = {An adjacency-based test pattern generator for low power BIST design},
  author = {Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch},
  author_short = {Girard, P. and Guiller, L. and Landrault, C. and Pravossoudovitch, S.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2000},
  key = {dblp3906134},
  id = {dblp3906134},
  biburl = {http://www.dblp.org/rec/bibtex/conf/ats/GirardGLP00},
  url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893667},
  conference = {Asian Test Symposium},
  pages = {459-464},
  text = {Asian Test Symposium 2000:459-464},
  booktitle = {Proceedings of Asian Test Symposium}
}

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