Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. Girard, P., Landrault, C., Pravossoudovitch, S., & Virazel, A. In Proceedings of International On-Line Testing Workshop (IOLTW), pages 121-126, 2000.
Paper bibtex @inproceedings{ dblp3938302,
title = {Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults},
author = {Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel},
author_short = {Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2000},
key = {dblp3938302},
id = {dblp3938302},
biburl = {http://www.dblp.org/rec/bibtex/conf/iolts/GirardLPV00},
url = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856623},
conference = {IOLTW},
pages = {121-126},
text = {IOLTW 2000:121-126},
booktitle = {Proceedings of International On-Line Testing Workshop (IOLTW)}
}
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