Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. Girard, P., Landrault, C., Pravossoudovitch, S., & Virazel, A. In Proceedings of International On-Line Testing Workshop (IOLTW), pages 121-126, 2000.
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults [link]Paper  bibtex   
@inproceedings{ dblp3938302,
  title = {Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults},
  author = {Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel},
  author_short = {Girard, P. and Landrault, C. and Pravossoudovitch, S. and Virazel, A.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2000},
  key = {dblp3938302},
  id = {dblp3938302},
  biburl = {http://www.dblp.org/rec/bibtex/conf/iolts/GirardLPV00},
  url = {http://doi.ieeecomputersociety.org/10.1109/OLT.2000.856623},
  conference = {IOLTW},
  pages = {121-126},
  text = {IOLTW 2000:121-126},
  booktitle = {Proceedings of International On-Line Testing Workshop (IOLTW)}
}

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