Low Power Testing of VLSI Circuits: Problems and Solutions. Girard, P. In Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 173-180, 2000. Paper bibtex @inproceedings{ dblp3940602,
title = {Low Power Testing of VLSI Circuits: Problems and Solutions},
author = {Patrick Girard},
author_short = {Girard, P.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2000},
key = {dblp3940602},
id = {dblp3940602},
biburl = {http://www.dblp.org/rec/bibtex/conf/isqed/Girard00},
url = {http://dx.doi.org/10.1109/ISQED.2000.838871},
conference = {ISQED},
pages = {173-180},
text = {ISQED 2000:173-180},
booktitle = {Proceedings of International Symposium on Quality Electronic Design (ISQED)}
}
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