Low Power Testing of VLSI Circuits: Problems and Solutions. Girard, P. In Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 173-180, 2000.
Low Power Testing of VLSI Circuits: Problems and Solutions [link]Paper  bibtex   
@inproceedings{ dblp3940602,
  title = {Low Power Testing of VLSI Circuits: Problems and Solutions},
  author = {Patrick Girard},
  author_short = {Girard, P.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2000},
  key = {dblp3940602},
  id = {dblp3940602},
  biburl = {http://www.dblp.org/rec/bibtex/conf/isqed/Girard00},
  url = {http://dx.doi.org/10.1109/ISQED.2000.838871},
  conference = {ISQED},
  pages = {173-180},
  text = {ISQED 2000:173-180},
  booktitle = {Proceedings of International Symposium on Quality Electronic Design (ISQED)}
}

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