Special Techniques in the X-Ray Analysis of Samples

Special Techniques in the X-Ray Analysis of Samples. Goldstein, J. I. & Colby, J. W. In Goldstein, J. I. & Yakowitz, H., editors, Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, pages 435–489. Springer US, Boston, MA, 1975. 00000

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The x-ray signals obtained from the SEM-EPMA are most often used either to identify the elements present in a sample or to measure the relative or actual amounts of these elements in localized areas of the sample. The methods for determining the presence of a given element by the wavelength-or energy-dispersive method have been described in previous chapters. Similarly, the methods of scanning x-ray analysis and quantitative analysis have been discussed in some detail (Chapters IX–XI).

@incollection{goldstein_special_1975,
	address = {Boston, MA},
	title = {Special {Techniques} in the {X}-{Ray} {Analysis} of {Samples}},
	isbn = {978-1-4613-4422-3},
	url = {https://doi.org/10.1007/978-1-4613-4422-3_12},
	abstract = {The x-ray signals obtained from the SEM-EPMA are most often used either to identify the elements present in a sample or to measure the relative or actual amounts of these elements in localized areas of the sample. The methods for determining the presence of a given element by the wavelength-or energy-dispersive method have been described in previous chapters. Similarly, the methods of scanning x-ray analysis and quantitative analysis have been discussed in some detail (Chapters IX–XI).},
	language = {en},
	urldate = {2020-03-28},
	booktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},
	publisher = {Springer US},
	author = {Goldstein, J. I. and Colby, J. W.},
	editor = {Goldstein, Joseph I. and Yakowitz, Harvey},
	year = {1975},
	doi = {10.1007/978-1-4613-4422-3_12},
	note = {00000 },
	keywords = {Instrument Response Function, Mass Absorption Coefficient, Mass Thickness, Silicon Monoxide, Trace Element Analysis},
	pages = {435--489},
}

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