Introduction. Goldstein, J. I., Yakowitz, H., & Newbury, D. E. In Goldstein, J. I. & Yakowitz, H., editors, Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis, pages 1–19. Springer US, Boston, MA, 1975. 00000 ![Introduction [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex In our rapidly expanding technology, the scientist today is more frequently required to observe and correctly explain phenomena occurring on a micrometer (μm) and submicrometer scale. The electron microprobe and scanning electron microscope are two powerful instruments which permit the characterization of heterogeneous materials and surfaces on such a local scale. In both instruments, the area to be examined is irradiated with a finely focused electron beam, which may be static, or swept in a raster across the surface of the specimen. The types of signals which are produced when the focused electron beam impinges on a specimen surface include secondary electrons, backscattered electrons, characteristic x-rays, Auger electrons, and photons of various energies. They are obtained from specific emission volumes within the sample and are used to measure many characteristics of the sample (composition, surface topography, crystallography, etc.).
@incollection{goldstein_introduction_1975,
address = {Boston, MA},
title = {Introduction},
isbn = {978-1-4613-4422-3},
url = {https://doi.org/10.1007/978-1-4613-4422-3_1},
abstract = {In our rapidly expanding technology, the scientist today is more frequently required to observe and correctly explain phenomena occurring on a micrometer (μm) and submicrometer scale. The electron microprobe and scanning electron microscope are two powerful instruments which permit the characterization of heterogeneous materials and surfaces on such a local scale. In both instruments, the area to be examined is irradiated with a finely focused electron beam, which may be static, or swept in a raster across the surface of the specimen. The types of signals which are produced when the focused electron beam impinges on a specimen surface include secondary electrons, backscattered electrons, characteristic x-rays, Auger electrons, and photons of various energies. They are obtained from specific emission volumes within the sample and are used to measure many characteristics of the sample (composition, surface topography, crystallography, etc.).},
language = {en},
urldate = {2020-03-28},
booktitle = {Practical {Scanning} {Electron} {Microscopy}: {Electron} and {Ion} {Microprobe} {Analysis}},
publisher = {Springer US},
author = {Goldstein, J. I. and Yakowitz, H. and Newbury, D. E.},
editor = {Goldstein, Joseph I. and Yakowitz, Harvey},
year = {1975},
doi = {10.1007/978-1-4613-4422-3_1},
note = {00000 },
keywords = {Dental Alloy, Electron Microprobe, Electron Optic System, Focus Electron Beam, Scanning Transmission Electron Microscope},
pages = {1--19},
}
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