Microscopic scan-free surface profiling over extended axial ranges by point-spread-function engineering. Gordon-Soffer, R., Weiss, L., Eshel, R., Ferdman, B., Nehme, E., Bercovici, M., & Shechtman, Y. Science advances, 2020. doi abstract bibtex Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC). The shape of a surface, i.e., its topography, influences many functional properties of a material; hence, characterization is critical in a wide variety of applications. Two notable challenges are profiling temporally changing structures, which requires high-speed acquisition, and capturing geometries with large axial steps. Here, we leverage point-spread-function engineering for scan-free, dynamic, microsurface profiling. The presented method is robust to axial steps and acquires full fields of view at camera-limited framerates. We present two approaches for implementation: fluorescence-based and label-free surface profiling, demonstrating the applicability to a variety of sample geometries and surface types.
@article{
title = {Microscopic scan-free surface profiling over extended axial ranges by point-spread-function engineering},
type = {article},
year = {2020},
volume = {6},
id = {2ad3f076-d21c-3cdc-b2e4-35e8c0690921},
created = {2020-11-07T23:59:00.000Z},
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last_modified = {2020-11-11T12:12:00.433Z},
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abstract = {Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC). The shape of a surface, i.e., its topography, influences many functional properties of a material; hence, characterization is critical in a wide variety of applications. Two notable challenges are profiling temporally changing structures, which requires high-speed acquisition, and capturing geometries with large axial steps. Here, we leverage point-spread-function engineering for scan-free, dynamic, microsurface profiling. The presented method is robust to axial steps and acquires full fields of view at camera-limited framerates. We present two approaches for implementation: fluorescence-based and label-free surface profiling, demonstrating the applicability to a variety of sample geometries and surface types.},
bibtype = {article},
author = {Gordon-Soffer, R. and Weiss, L.E. and Eshel, R. and Ferdman, B. and Nehme, E. and Bercovici, M. and Shechtman, Y.},
doi = {10.1126/sciadv.abc0332},
journal = {Science advances},
number = {44}
}
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