Quantitative defects management in iterative development with BiDefect. Gou, L., Wang, Q., Yuan, J., Yang, Y., Li, M., & Jiang, N. Software Process: Improvement and Practice (SOPR), 14(4):227-241, 2009.
Quantitative defects management in iterative development with BiDefect [link]Paper  bibtex   
@article{ dblp3111798,
  title = {Quantitative defects management in iterative development with BiDefect},
  author = {Lang Gou and Qing Wang and Jun Yuan and Ye Yang and Mingshu Li and Nan Jiang},
  author_short = {Gou, L. and Wang, Q. and Yuan, J. and Yang, Y. and Li, M. and Jiang, N.},
  bibtype = {article},
  type = {article},
  year = {2009},
  key = {dblp3111798},
  id = {dblp3111798},
  biburl = {http://www.dblp.org/rec/bibtex/journals/sopr/GouWYYLJ09},
  url = {http://dx.doi.org/10.1002/spip.413},
  journal = {Software Process: Improvement and Practice (SOPR)},
  pages = {227-241},
  number = {4},
  volume = {14},
  text = {Software Process: Improvement and Practice (SOPR) 14(4):227-241 (2009)}
}

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