Numerical modeling and measurements of radiated emissions from integrated circuits inside telecommunications equipment. Goudos, S., K. & Hilas, C., S. WSEAS Transactions on Communications, 6(4):499-504, 2007.
abstract   bibtex   
A numerical approach to the modeling of Electromagnetic Interference (EMI) from the emissions of Integrated Circuits (ICs) inside rectangular metallic enclosures of communications devices is presented. The ICs are modeled as small magnetic or electric dipoles. Radiated emissions from ICs are examined and measured using magnetic probes on various types of network equipment. Based on these measurements source amplitude and existence probabilistic models are created. Closed form expressions for the induced electric field on the metallic walls are given. Electric field calculation examples show the major trends in a multiple source system and help perform a worst-case analysis. The applications of the above approach to the PCB design process are discussed.
@article{
 title = {Numerical modeling and measurements of radiated emissions from integrated circuits inside telecommunications equipment},
 type = {article},
 year = {2007},
 keywords = {Electromagnetic compatibility,Electromagnetic interference,Green's functions calculation,Magnetic probe measurements,Numerical modeling},
 pages = {499-504},
 volume = {6},
 id = {11724eba-3614-3a83-aca5-1d2b46a63d1a},
 created = {2020-02-29T16:57:42.122Z},
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 last_modified = {2023-02-11T18:54:01.571Z},
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 abstract = {A numerical approach to the modeling of Electromagnetic Interference (EMI) from the emissions of Integrated Circuits (ICs) inside rectangular metallic enclosures of communications devices is presented. The ICs are modeled as small magnetic or electric dipoles. Radiated emissions from ICs are examined and measured using magnetic probes on various types of network equipment. Based on these measurements source amplitude and existence probabilistic models are created. Closed form expressions for the induced electric field on the metallic walls are given. Electric field calculation examples show the major trends in a multiple source system and help perform a worst-case analysis. The applications of the above approach to the PCB design process are discussed.},
 bibtype = {article},
 author = {Goudos, S. K. and Hilas, C. S.},
 journal = {WSEAS Transactions on Communications},
 number = {4}
}

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