Predicting Fault Incidence Using Software Change History. Graves, T. L., Karr, A. F., Marron, J., & Siy, H. IEEE Computer Society Trans. Software Engineering, 26(7):653-661, IEEE Computer Society, Los Alamitos, CA, USA, 04, 2000.
doi  bibtex   
@article{Graves&al2000,
  added-at = {2007-09-26T12:09:12.000+0200},
  address = {Los Alamitos, CA, USA},
  author = {Graves, Todd L. and Karr, Alan F. and Marron, J.S. and Siy, Harvey},
  biburl = {https://www.bibsonomy.org/bibtex/26b3622584e7f42043a62509a7d688f5b/kimmens},
  description = {AOEvolutionchapter short paper},
  doi = {http://doi.ieeecomputersociety.org/10.1109/32.859533},
  interhash = {a1cb6dd1e38a1ab97abdc81733b72313},
  intrahash = {6b3622584e7f42043a62509a7d688f5b},
  issn = {0098-5589},
  journal = { IEEE Computer Society Trans. Software Engineering},
  keywords = {imported},
  month = {04},
  number = 7,
  pages = {653-661},
  publisher = {IEEE Computer Society},
  timestamp = {2007-09-26T12:09:18.000+0200},
  title = {Predicting Fault Incidence Using Software Change History},
  volume = 26,
  year = 2000
}

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