Transmission Electron Microscopy (STEM and TEM). Grimley, E. D & LeBeau, J. M In Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices, pages 317–340. Elsevier, 2019. doi bibtex @INCOLLECTION{Grimley2019-fv,
title = "{Transmission Electron Microscopy (STEM and TEM)}",
author = "Grimley, Everett D and LeBeau, James M",
booktitle = "{Ferroelectricity in Doped Hafnium Oxide: Materials, Properties
and Devices}",
publisher = "Elsevier",
pages = "317--340",
year = 2019,
keywords = "LeBeau Group",
doi = "10.1016/b978-0-08-102430-0.00015-2"
}
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