Transmission Electron Microscopy (STEM and TEM). Grimley, E. D & LeBeau, J. M In Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices, pages 317–340. Elsevier, 2019.
doi  bibtex   
@INCOLLECTION{Grimley2019-fv,
  title     = "{Transmission Electron Microscopy (STEM and TEM)}",
  author    = "Grimley, Everett D and LeBeau, James M",
  booktitle = "{Ferroelectricity in Doped Hafnium Oxide: Materials, Properties
               and Devices}",
  publisher = "Elsevier",
  pages     = "317--340",
  year      =  2019,
  keywords  = "LeBeau Group",
  doi       = "10.1016/b978-0-08-102430-0.00015-2"
}

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