Sampling Cardinality-Based Feature Models. Güthing, L., Weiß, M., Schaefer, I., & Lochau, M. In Kehrer, T., Huchard, M., Teixeira, L., & Birchler, C., editors, Proceedings of the 18th International Working Conference on Variability Modelling of Software-Intensive Systems, VaMoS 2024, Bern, Switzerland, February 7-9, 2024, pages 46–55, 2024. ACM.
Sampling Cardinality-Based Feature Models [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/vamos/GuthingWSL24,
  author       = {Lukas G{\"{u}}thing and
                  Mathis Wei{\ss} and
                  Ina Schaefer and
                  Malte Lochau},
  editor       = {Timo Kehrer and
                  Marianne Huchard and
                  Leopoldo Teixeira and
                  Christian Birchler},
  title        = {Sampling Cardinality-Based Feature Models},
  booktitle    = {Proceedings of the 18th International Working Conference on Variability
                  Modelling of Software-Intensive Systems, VaMoS 2024, Bern, Switzerland,
                  February 7-9, 2024},
  pages        = {46--55},
  publisher    = {{ACM}},
  year         = {2024},
  url          = {https://doi.org/10.1145/3634713.3634719},
  doi          = {10.1145/3634713.3634719},
  timestamp    = {Fri, 26 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vamos/GuthingWSL24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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