Sampling Cardinality-Based Feature Models. Güthing, L., Weiß, M., Schaefer, I., & Lochau, M. In Kehrer, T., Huchard, M., Teixeira, L., & Birchler, C., editors, Proceedings of the 18th International Working Conference on Variability Modelling of Software-Intensive Systems, VaMoS 2024, Bern, Switzerland, February 7-9, 2024, pages 46–55, 2024. ACM.
Paper doi bibtex @inproceedings{DBLP:conf/vamos/GuthingWSL24,
author = {Lukas G{\"{u}}thing and
Mathis Wei{\ss} and
Ina Schaefer and
Malte Lochau},
editor = {Timo Kehrer and
Marianne Huchard and
Leopoldo Teixeira and
Christian Birchler},
title = {Sampling Cardinality-Based Feature Models},
booktitle = {Proceedings of the 18th International Working Conference on Variability
Modelling of Software-Intensive Systems, VaMoS 2024, Bern, Switzerland,
February 7-9, 2024},
pages = {46--55},
publisher = {{ACM}},
year = {2024},
url = {https://doi.org/10.1145/3634713.3634719},
doi = {10.1145/3634713.3634719},
timestamp = {Fri, 26 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vamos/GuthingWSL24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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