Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy. Gu, L., Sigle, W., T.Koch, C., Nelayah, J., Srot, V., & van Aken, P. A. Ultramicroscopy, 109:1164–1170, 2009.
bibtex   
@article{l._gu_mapping_2009,
	title = {Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy},
	volume = {109},
	journal = {Ultramicroscopy},
	author = {L. Gu and W. Sigle and C. T.Koch and J. Nelayah and V. Srot and P. A. van Aken},
	year = {2009},
	pages = {1164--1170},
}

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