Probabilistic fatigue life prediction using ultrasonic inspection data considering equivalent initial flaw size uncertainty. Guan, X, Zhang, J, Kadau, K, & Zhou, S. In AIP conference proceedings, volume 1511, pages 620–627, 2013. American Institute of Physics.
bibtex   
@inproceedings{guan2013probabilistic,
  title={Probabilistic fatigue life prediction using ultrasonic inspection data considering equivalent initial flaw size uncertainty},
  author={Guan, X and Zhang, J and Kadau, K and Zhou, SK},
  booktitle={AIP conference proceedings},
  volume={1511},
  number={1},
  pages={620--627},
  year={2013},
  organization={American Institute of Physics}
}

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