Simulation and analysis of negative-bias temperature instability aging on power analysis attacks. Guo, X., Karimi, N., Regazzoni, F., Jin, C., & Karri, R. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2015, Washington, DC, USA, 5-7 May, 2015, pages 124–129, 2015. IEEE Computer Society.
Simulation and analysis of negative-bias temperature instability aging on power analysis attacks [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/host/GuoKRJK15,
  author    = {Xiaofei Guo and
               Naghmeh Karimi and
               Francesco Regazzoni and
               Chenglu Jin and
               Ramesh Karri},
  title     = {Simulation and analysis of negative-bias temperature instability aging
               on power analysis attacks},
  booktitle = {{IEEE} International Symposium on Hardware Oriented Security and Trust,
               {HOST} 2015, Washington, DC, USA, 5-7 May, 2015},
  pages     = {124--129},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {https://doi.org/10.1109/HST.2015.7140250},
  doi       = {10.1109/HST.2015.7140250},
  timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/host/GuoKRJK15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0