Susceptible Workload Evaluation and Protection using Selective Fault Tolerance. Gutierrez, M. D., Tenentes, V., Rossi, D., & Kazmierski, T. J. J. Electronic Testing, 33(4):463-477, 2017. Link Paper bibtex @article{journals/et/GutierrezTRK17,
added-at = {2018-06-26T00:00:00.000+0200},
author = {Gutierrez, Mauricio D. and Tenentes, Vasileios and Rossi, Daniele and Kazmierski, Tom J.},
biburl = {https://www.bibsonomy.org/bibtex/206a272876e645f7235845f10eae14814/dblp},
ee = {https://doi.org/10.1007/s10836-017-5668-7},
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journal = {J. Electronic Testing},
keywords = {dblp},
number = 4,
pages = {463-477},
timestamp = {2018-06-27T11:59:17.000+0200},
title = {Susceptible Workload Evaluation and Protection using Selective Fault Tolerance.},
url = {http://dblp.uni-trier.de/db/journals/et/et33.html#GutierrezTRK17},
volume = 33,
year = 2017
}
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