Strain mapping in amorphous germanium thin films with scanning reflectance anisotropy microscopy. Haake, F., Sendra, J., Calvo, M., Galinski, H., & Spolenak, R. Applied Physics Letters, AIP Publishing, July, 2024. ![Strain mapping in amorphous germanium thin films with scanning reflectance anisotropy microscopy [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi bibtex @article{Haake_2024, title={Strain mapping in amorphous germanium thin films with scanning reflectance anisotropy microscopy}, volume={125}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/5.0218645}, DOI={10.1063/5.0218645}, number={4}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Haake, Fabian and Sendra, Joan and Calvo, Micha and Galinski, Henning and Spolenak, Ralph}, year={2024}, month=jul }
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