Independent Testing of Untrusted FPGAs for Faulty Interconnnect. Haroldsen, T., French, M., Sung, T., Glick, D., Danner, J., & Lerner, L. In Government Microcircuit Applications and Critical Technology Conference, March, 2021. to appear
bibtex   
@inproceedings{cift-gomac:2021,
 author = {Haroldsen, Travis and French, Matthew and T. Sung and D. Glick and J. Danner and L. Lerner},
 title = {Independent Testing of Untrusted FPGAs for Faulty Interconnnect},
 booktitle = {Government Microcircuit Applications and Critical Technology Conference},
 month = {March},
 year = {2021},
 note = {to appear}
}

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