Efficient Porting of FPGA Independent Testing Within and Across Vendors. Haroldsen, T., Sung, T., Shears, O., Glick, D., & Danner, J. In Government Microcircuit Applications and Critical Technology Conference, March, 2023.
bibtex   
@inproceedings{cift-gomac:2023,
 author = {T. Haroldsen and T.Y. Sung and O. Shears and D. Glick and J. Danner},
 title = {{Efficient Porting of FPGA Independent Testing Within and Across Vendors}},
 booktitle = {Government Microcircuit Applications and Critical Technology Conference},
 month = {March},
 year = {2023},
}

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