Efficient Porting of FPGA Independent Testing Within and Across Vendors. Haroldsen, T., Sung, T., Shears, O., Glick, D., & Danner, J. In Government Microcircuit Applications and Critical Technology Conference, March, 2023. bibtex @inproceedings{cift-gomac:2023,
author = {T. Haroldsen and T.Y. Sung and O. Shears and D. Glick and J. Danner},
title = {{Efficient Porting of FPGA Independent Testing Within and Across Vendors}},
booktitle = {Government Microcircuit Applications and Critical Technology Conference},
month = {March},
year = {2023},
}
Downloads: 0
{"_id":"BJHhTN3MLPY3MP6H6","bibbaseid":"haroldsen-sung-shears-glick-danner-efficientportingoffpgaindependenttestingwithinandacrossvendors-2023","author_short":["Haroldsen, T.","Sung, T.","Shears, O.","Glick, D.","Danner, J."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["T."],"propositions":[],"lastnames":["Haroldsen"],"suffixes":[]},{"firstnames":["T.Y."],"propositions":[],"lastnames":["Sung"],"suffixes":[]},{"firstnames":["O."],"propositions":[],"lastnames":["Shears"],"suffixes":[]},{"firstnames":["D."],"propositions":[],"lastnames":["Glick"],"suffixes":[]},{"firstnames":["J."],"propositions":[],"lastnames":["Danner"],"suffixes":[]}],"title":"Efficient Porting of FPGA Independent Testing Within and Across Vendors","booktitle":"Government Microcircuit Applications and Critical Technology Conference","month":"March","year":"2023","bibtex":"@inproceedings{cift-gomac:2023,\n author = {T. Haroldsen and T.Y. Sung and O. Shears and D. Glick and J. Danner},\n title = {{Efficient Porting of FPGA Independent Testing Within and Across Vendors}},\n booktitle = {Government Microcircuit Applications and Critical Technology Conference},\n month = {March},\n year = {2023},\n}\n\n","author_short":["Haroldsen, T.","Sung, T.","Shears, O.","Glick, D.","Danner, J."],"bibbaseid":"haroldsen-sung-shears-glick-danner-efficientportingoffpgaindependenttestingwithinandacrossvendors-2023","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://bibbase.org/f/PFme4g7kvhRzCxeKy/tsung-2023.bib","dataSources":["hXPbxzsEqzDTbBrva","hab4gWBMe5b4a6Hhz"],"keywords":[],"search_terms":["efficient","porting","fpga","independent","testing","within","vendors","haroldsen","sung","shears","glick","danner"],"title":"Efficient Porting of FPGA Independent Testing Within and Across Vendors","year":2023}