Independent Functional Testing for Intel Stratix 10. Haroldsen, T., Sung, T., Shears, O., Glick, D., & Danner, J. In Government Microcircuit Applications and Critical Technology Conference, March, 2024. bibtex @inproceedings{cift-gomac:2024,
author = {T. Haroldsen and T.Y. Sung and O. Shears and D. Glick and J. Danner},
title = {{Independent Functional Testing for Intel Stratix 10}},
booktitle = {Government Microcircuit Applications and Critical Technology Conference},
month = {March},
year = {2024},
}
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