Towards traceable test-driven development. Hayes, J. H., Dekhtyar, A., & Janzen, D. S. In Proceedings of the 2009 ICSE Workshop on Traceability in Emerging Forms of Software Engineering, pages 26–30, Washington, DC, USA, 2009. IEEE Computer Society.
doi  bibtex   
@inproceedings{hayes_towards_2009,
	address = {Washington, DC, USA},
	title = {Towards traceable test-driven development},
	isbn = {978-1-4244-3741-2},
	doi = {http://dx.doi.org/10.1109/TEFSE.2009.5069579},
	booktitle = {Proceedings of the 2009 {ICSE} {Workshop} on {Traceability} in {Emerging} {Forms} of {Software} {Engineering}},
	publisher = {IEEE Computer Society},
	author = {Hayes, Jane Huffman and Dekhtyar, Alex and Janzen, David S.},
	year = {2009},
	pages = {26--30},
}

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