Deep Residual Learning for Image Recognition. He, K., Zhang, X., Ren, S., & Sun, J. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016, pages 770-778, 2016. IEEE Computer Society.
bibtex   
@inproceedings{
 title = {Deep Residual Learning for Image Recognition},
 type = {inproceedings},
 year = {2016},
 pages = {770-778},
 publisher = {IEEE Computer Society},
 id = {a347851b-800d-3188-8ce8-a628b86a1122},
 created = {2024-02-14T13:08:58.578Z},
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 last_modified = {2024-02-14T13:08:58.578Z},
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 starred = {false},
 authored = {false},
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 citation_key = {he2016deepresiduallearning},
 source_type = {inproceedings},
 private_publication = {false},
 bibtype = {inproceedings},
 author = {He, Kaiming and Zhang, Xiangyu and Ren, Shaoqing and Sun, Jian},
 booktitle = {2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016}
}

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