Deep Residual Learning for Image Recognition. He, K., Zhang, X., Ren, S., & Sun, J. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016, pages 770-778, 2016. IEEE Computer Society. bibtex @inproceedings{
title = {Deep Residual Learning for Image Recognition},
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