Metric forensics: a multi-level approach for mining volatile graphs. Henderson, K., Eliassi-Rad, T., Faloutsos, C., Akoglu, L., Li, L., Maruhashi, K., Prakash, B. A., & Tong, H. In Rao, B., Krishnapuram, B., Tomkins, A., & Yang, Q., editors, Proceedings of the 16th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, July 25-28, 2010, pages 163–172, 2010. ACM.
Metric forensics: a multi-level approach for mining volatile graphs [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/kdd/HendersonEFALMPT10,
  author       = {Keith Henderson and
                  Tina Eliassi{-}Rad and
                  Christos Faloutsos and
                  Leman Akoglu and
                  Lei Li and
                  Koji Maruhashi and
                  B. Aditya Prakash and
                  Hanghang Tong},
  editor       = {Bharat Rao and
                  Balaji Krishnapuram and
                  Andrew Tomkins and
                  Qiang Yang},
  title        = {Metric forensics: a multi-level approach for mining volatile graphs},
  booktitle    = {Proceedings of the 16th {ACM} {SIGKDD} International Conference on
                  Knowledge Discovery and Data Mining, Washington, DC, USA, July 25-28,
                  2010},
  pages        = {163--172},
  publisher    = {{ACM}},
  year         = {2010},
  url          = {https://doi.org/10.1145/1835804.1835828},
  doi          = {10.1145/1835804.1835828},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/kdd/HendersonEFALMPT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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