Extending an IEEE 42010-Compliant Viewpoint-Based Engineering-Framework for Embedded Systems to Support Variant Management. Heuer, A., Kaufmann, T., & Weyer, T. In Schirner, G., Götz, M., Rettberg, A., Zanella, M. C., & Rammig, F. J., editors, Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC 10 International Embedded Systems Symposium (IESS 2013), pages 283–292, Heidelberg, 2013. Springer. bibtex @inproceedings{Heuer.2013b,
author = {Heuer, Andr{\'e} and Kaufmann, Tobias and Weyer, Thorsten},
title = {Extending an IEEE 42010-Compliant Viewpoint-Based Engineering-Framework for Embedded Systems to Support Variant Management},
keywords = {sse},
pages = {283--292},
publisher = {Springer},
editor = {Schirner, Gunar and G{\"o}tz, Marcelo and Rettberg, Achim and Zanella, Mauro Cesar and Rammig, Franz J.},
booktitle = {Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC 10 International Embedded Systems Symposium (IESS 2013)},
year = {2013},
address = {Heidelberg}
}
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