@article{
 title = {Mechanical Testing for Microelectronics R & D and Production},
 type = {article},
 id = {8f33a7fa-af35-3778-b034-70ae50193136},
 created = {2012-12-06T09:11:04.000Z},
 file_attached = {true},
 profile_id = {0b777e31-8c9d-39dd-97a3-3e054bd99cfe},
 group_id = {764582e8-5773-3a66-8d6b-9b40e4fb5a88},
 last_modified = {2017-03-14T17:27:14.020Z},
 read = {true},
 starred = {false},
 authored = {false},
 confirmed = {true},
 hidden = {false},
 citation_key = {High},
 bibtype = {article},
 author = {High, Ultra and Testing, Precision}
}

{"_id":"XRCLdZRokuHWKjkDw","bibbaseid":"high-testing-mechanicaltestingformicroelectronicsrdandproduction","downloads":0,"creationDate":"2017-05-23T14:37:05.453Z","title":"Mechanical Testing for Microelectronics R & D and Production","author_short":["High, U.","Testing, P."],"year":null,"bibtype":"article","biburl":null,"bibdata":{"title":"Mechanical Testing for Microelectronics R & D and Production","type":"article","id":"8f33a7fa-af35-3778-b034-70ae50193136","created":"2012-12-06T09:11:04.000Z","file_attached":"true","profile_id":"0b777e31-8c9d-39dd-97a3-3e054bd99cfe","group_id":"764582e8-5773-3a66-8d6b-9b40e4fb5a88","last_modified":"2017-03-14T17:27:14.020Z","read":"true","starred":false,"authored":false,"confirmed":"true","hidden":false,"citation_key":"High","bibtype":"article","author":"High, Ultra and Testing, Precision","bibtex":"@article{\n title = {Mechanical Testing for Microelectronics R & D and Production},\n type = {article},\n id = {8f33a7fa-af35-3778-b034-70ae50193136},\n created = {2012-12-06T09:11:04.000Z},\n file_attached = {true},\n profile_id = {0b777e31-8c9d-39dd-97a3-3e054bd99cfe},\n group_id = {764582e8-5773-3a66-8d6b-9b40e4fb5a88},\n last_modified = {2017-03-14T17:27:14.020Z},\n read = {true},\n starred = {false},\n authored = {false},\n confirmed = {true},\n hidden = {false},\n citation_key = {High},\n bibtype = {article},\n author = {High, Ultra and Testing, Precision}\n}","author_short":["High, U.","Testing, P."],"urls":{"Paper":"http://bibbase.org/service/mendeley/c6c6f844-18d2-32db-a619-2e915134a952/file/0f136abb-0630-d367-7295-a96ea48c84e4/Mechanical_Testing_for_Microelectronics_R__D_and_Production.pdf.pdf"},"bibbaseid":"high-testing-mechanicaltestingformicroelectronicsrdandproduction","role":"author","downloads":0},"search_terms":["mechanical","testing","microelectronics","production","high","testing"],"keywords":[],"authorIDs":[]}