@article{
 title = {Vacuum thermal evaporated (AsSe)1-x(AgI)x films: Studies by spectroscopic ellipsometry and atomic-force microscopy},
 type = {article},
 year = {2009},
 identifiers = {[object Object]},
 keywords = {AFM imaging,Chalcogenide thin films,Optical properties,Spectroscopic ellipsometry},
 pages = {1265-1268},
 volume = {11},
 websites = {https://bib.irb.hr/datoteka/714345.HINEVA_2009.pdf},
 id = {efce0dd9-8073-3c8f-b2a9-73be0155cc5c},
 created = {2016-12-14T15:29:00.000Z},
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 profile_id = {12182ba0-f80b-33ff-8da5-1813b38b682d},
 group_id = {a98b63fd-d1ec-31d9-941c-369676d9ff02},
 last_modified = {2017-03-14T14:52:49.557Z},
 read = {false},
 starred = {false},
 authored = {false},
 confirmed = {true},
 hidden = {false},
 citation_key = {Hineva2009},
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 abstract = {Vacuum thermal evaporated (AsSe)1-x(AgI)x films with different compositions (x = 5, 15, 20 and 30 mol % ) have been studied by spectroscopic ellipsometry and atomic-force microscopy. The ellipsometric results have shown that the optical constants and optical band gap energy values vary with increasing AgI content in the films. Additional XRD measurements revealed that the films are amorphous with more ordered structures at larger x values. AFM images visualized that randomly distributed hillocks emerged from the smooth film surface yielding an rms roughness of 0.6-1.0 nm with a tendency to increase with increasing AgI content.},
 bibtype = {article},
 author = {Hineva, T and Szekeres, A and Petkov, P and Anastasescu, M and Gartner, M and Salamon, K},
 journal = {Journal of Optoelectronics and Advanced Materials},
 number = {9}
}

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