{"_id":"duaJ5TKMnuNqCAP9a","bibbaseid":"hirunyawanakul-kaoungku-kerdprasop-kerdprasop-featureselectiontoimproveperformanceofyieldpredictioninharddiskdrivemanufacturing-2020","author_short":["Hirunyawanakul, A.","Kaoungku, N.","Kerdprasop, N.","Kerdprasop, K."],"bibdata":{"bibtype":"article","type":"article","title":"Feature selection to improve performance of yield prediction in hard disk drive manufacturing","author":[{"propositions":[],"lastnames":["Hirunyawanakul"],"firstnames":["Anusara"],"suffixes":[]},{"propositions":[],"lastnames":["Kaoungku"],"firstnames":["Nuntawut"],"suffixes":[]},{"propositions":[],"lastnames":["Kerdprasop"],"firstnames":["Nittaya"],"suffixes":[]},{"propositions":[],"lastnames":["Kerdprasop"],"firstnames":["Kittisak"],"suffixes":[]}],"journal":"Int. J. Electr. Electron. Eng. Telecommun.","volume":"9","pages":"420–428","year":"2020","bibtex":"@article{hirunyawanakul2020feature,\n title={Feature selection to improve performance of yield prediction in hard disk drive manufacturing},\n author={Hirunyawanakul, Anusara and Kaoungku, Nuntawut and Kerdprasop, Nittaya and Kerdprasop, Kittisak},\n journal={Int. J. Electr. Electron. Eng. Telecommun.},\n volume={9},\n pages={420--428},\n year={2020}\n}\n\n","author_short":["Hirunyawanakul, A.","Kaoungku, N.","Kerdprasop, N.","Kerdprasop, K."],"key":"hirunyawanakul2020feature","id":"hirunyawanakul2020feature","bibbaseid":"hirunyawanakul-kaoungku-kerdprasop-kerdprasop-featureselectiontoimproveperformanceofyieldpredictioninharddiskdrivemanufacturing-2020","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/f/HnQC7A6C8WxhqExKR/CPE_Nuntawut_Kaoungku.bib","dataSources":["StTYvCENzGSY4zu5S","i2p6t5GidYbtznHvX","ZMigHSvPR5DDSsqAW","p7TcfQRkYAco4B7Nv","yG3Dz9pr4Ys2nNyak","LrA9hyCDCAzrqZG4G"],"keywords":[],"search_terms":["feature","selection","improve","performance","yield","prediction","hard","disk","drive","manufacturing","hirunyawanakul","kaoungku","kerdprasop","kerdprasop"],"title":"Feature selection to improve performance of yield prediction in hard disk drive manufacturing","year":2020}