Helium ion microscopy. Hlawacek, G., Veligura, V., van Gastel, R., Poelsema, B., & Gastel, R. V. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 32(2):020801, 3, 2014. Pdf 0 Mendeley Paper doi abstract bibtex Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution microscopy and nanofabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulating nanostructures but also allows to create these features. The latter can be achieved using resists or material removal due to sputtering. The close to free-form sculpting of structures over several length scales has been made possible by the extension of the method to other gases such as neon. A brief introduction of the underlying physics as well as a broad review of the applicability of the method is presented in this review.
@article{ mendeley_6367713891,
isauthor = {1},
issn = {2166-2746},
abstract = {Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution microscopy and nanofabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulating nanostructures but also allows to create these features. The latter can be achieved using resists or material removal due to sputtering. The close to free-form sculpting of structures over several length scales has been made possible by the extension of the method to other gases such as neon. A brief introduction of the underlying physics as well as a broad review of the applicability of the method is presented in this review.},
month = {3},
added = {1383882396},
year = {2014},
isstarred = {0},
id = {6367713891},
discipline = {Physics},
deletionpending = {0},
title = {Helium ion microscopy},
journal = {Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures},
version = {1399898361},
number = {2},
url_pdf_0 = {http://www.mendeley.com/download/public/19372381/6367713891/94378d180421a6de700b0a10811c98352e42afda/dl.pdf},
url_mendeley = {http://www.mendeley.com/c/6367713891/p/19372381/hlawacek-2014-helium-ion-microscopy/},
tags = {him},
isread = {1},
author = {Gregor {Hlawacek} and Vasilisa {Veligura} and Raoul {van Gastel} and Bene {Poelsema} and Raoul Van {Gastel}},
pages = {020801},
volume = {32},
doi = {10.1116/1.4863676},
url = {http://scitation.aip.org/content/avs/journal/jvstb/32/2/10.1116/1.4863676},
type = {Journal Article},
notes = {From Duplicate 2 ( Helium ion microscopy - Hlawacek, Gregor; Veligura, Vasilisa; van Gastel, Raoul; Poelsema, Bene )
From Duplicate 2 ( Helium Ion Microscopy - Hlawacek, Gregor; Veligura, Vasilisa; Gastel, Raoul Van; Poelsema, Bene )
invited review; submitted to J. Vac. Sci. Tech. B},
arxiv = {arXiv:1311.1711v1},
modified = {1399898361},
citation_key = {Hlawacek2013c},
journal = {Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures},
subdiscipline = {Condensed Matter Physics}
}
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{"_id":{"_str":"53726e3eb3aa04260500154d"},"__v":2,"authorIDs":[],"author_short":["Hlawacek, G.","Veligura, V.","van Gastel, R.","Poelsema, B.","Gastel, R.<nbsp>V."],"bibbaseid":"hlawacek-veligura-vangastel-poelsema-gastel-heliumionmicroscopy-2014","bibdata":{"downloads":0,"bibbaseid":"hlawacek-veligura-vangastel-poelsema-gastel-heliumionmicroscopy-2014","urls":{" pdf 0":"http://www.mendeley.com/download/public/19372381/6367713891/94378d180421a6de700b0a10811c98352e42afda/dl.pdf"," mendeley":"http://www.mendeley.com/c/6367713891/p/19372381/hlawacek-2014-helium-ion-microscopy/","Paper":"http://scitation.aip.org/content/avs/journal/jvstb/32/2/10.1116/1.4863676"},"role":"author","year":"2014","volume":"32","version":"1399898361","url_pdf_0":"http://www.mendeley.com/download/public/19372381/6367713891/94378d180421a6de700b0a10811c98352e42afda/dl.pdf","url_mendeley":"http://www.mendeley.com/c/6367713891/p/19372381/hlawacek-2014-helium-ion-microscopy/","url":"http://scitation.aip.org/content/avs/journal/jvstb/32/2/10.1116/1.4863676","type":"Journal Article","title":"Helium ion microscopy","tags":"him","subdiscipline":"Condensed Matter Physics","pages":"020801","number":"2","notes":"From Duplicate 2 ( Helium ion microscopy - Hlawacek, Gregor; Veligura, Vasilisa; van Gastel, Raoul; Poelsema, Bene ) From Duplicate 2 ( Helium Ion Microscopy - Hlawacek, Gregor; Veligura, Vasilisa; Gastel, Raoul Van; Poelsema, Bene ) invited review; submitted to J. Vac. Sci. Tech. B","month":"3","modified":"1399898361","key":"mendeley_6367713891","journal":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","isstarred":"0","issn":"2166-2746","isread":"1","isauthor":"1","id":"mendeley_6367713891","doi":"10.1116/1.4863676","discipline":"Physics","deletionpending":"0","citation_key":"Hlawacek2013c","bibtype":"article","bibtex":"@article{ mendeley_6367713891,\n isauthor = {1},\n issn = {2166-2746},\n abstract = {Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution microscopy and nanofabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulating nanostructures but also allows to create these features. The latter can be achieved using resists or material removal due to sputtering. The close to free-form sculpting of structures over several length scales has been made possible by the extension of the method to other gases such as neon. A brief introduction of the underlying physics as well as a broad review of the applicability of the method is presented in this review.},\n month = {3},\n added = {1383882396},\n year = {2014},\n isstarred = {0},\n id = {6367713891},\n discipline = {Physics},\n deletionpending = {0},\n title = {Helium ion microscopy},\n journal = {Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures},\n version = {1399898361},\n number = {2},\n url_pdf_0 = {http://www.mendeley.com/download/public/19372381/6367713891/94378d180421a6de700b0a10811c98352e42afda/dl.pdf},\n url_mendeley = {http://www.mendeley.com/c/6367713891/p/19372381/hlawacek-2014-helium-ion-microscopy/},\n tags = {him},\n isread = {1},\n author = {Gregor {Hlawacek} and Vasilisa {Veligura} and Raoul {van Gastel} and Bene {Poelsema} and Raoul Van {Gastel}},\n pages = {020801},\n volume = {32},\n doi = {10.1116/1.4863676},\n url = {http://scitation.aip.org/content/avs/journal/jvstb/32/2/10.1116/1.4863676},\n type = {Journal Article},\n notes = {From Duplicate 2 ( Helium ion microscopy - Hlawacek, Gregor; Veligura, Vasilisa; van Gastel, Raoul; Poelsema, Bene )\n \n From Duplicate 2 ( Helium Ion Microscopy - Hlawacek, Gregor; Veligura, Vasilisa; Gastel, Raoul Van; Poelsema, Bene )\n \ninvited review; submitted to J. Vac. Sci. Tech. B},\n arxiv = {arXiv:1311.1711v1},\n modified = {1399898361},\n citation_key = {Hlawacek2013c},\n journal = {Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures},\n subdiscipline = {Condensed Matter Physics}\n}","author_short":["Hlawacek, G.","Veligura, V.","van Gastel, R.","Poelsema, B.","Gastel, R.<nbsp>V."],"author":["Hlawacek, Gregor","Veligura, Vasilisa","van Gastel, Raoul","Poelsema, Bene","Gastel, Raoul Van"],"arxiv":"arXiv:1311.1711v1","added":"1383882396","abstract":"Helium ion microcopy based on gas field ion sources represents a new ultrahigh resolution microscopy and nanofabrication technique. It is an enabling technology that not only provides imagery of conducting as well as uncoated insulating nanostructures but also allows to create these features. The latter can be achieved using resists or material removal due to sputtering. The close to free-form sculpting of structures over several length scales has been made possible by the extension of the method to other gases such as neon. A brief introduction of the underlying physics as well as a broad review of the applicability of the method is presented in this review."},"bibtype":"article","biburl":"http://www.bibbase.org/mendeley/7d2fc6b346","downloads":0,"keywords":[],"search_terms":["helium","ion","microscopy","hlawacek","veligura","van gastel","poelsema","gastel"],"title":"Helium ion microscopy","year":2014,"dataSources":["qdYyfiawf738LAAL6"]}