Detecting Bad SNPs from Illumina BeadChips Using Jeffreys Distance. Hoang Nguyen, S., Sy Vinh, L., & Quang Le, S. In Proceedings of Knowledge and Systems Engineering (KSE), pages 18-25, 2012.
Detecting Bad SNPs from Illumina BeadChips Using Jeffreys Distance [link]Paper  bibtex   
@inproceedings{ dblp2280960,
  title = {Detecting Bad SNPs from Illumina BeadChips Using Jeffreys Distance},
  author = {Son Hoang Nguyen and Le Sy Vinh and Si Quang Le},
  author_short = {Hoang Nguyen, S. and Sy Vinh, L. and Quang Le, S.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2012},
  key = {dblp2280960},
  id = {dblp2280960},
  biburl = {http://www.dblp.org/rec/bibtex/conf/kse/NguyenVL12},
  url = {http://dx.doi.org/10.1109/KSE.2012.25},
  conference = {KSE},
  pages = {18-25},
  text = {KSE 2012:18-25},
  booktitle = {Proceedings of Knowledge and Systems Engineering (KSE)}
}

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