Detecting Bad SNPs from Illumina BeadChips Using Jeffreys Distance. Hoang Nguyen, S., Sy Vinh, L., & Quang Le, S. In Proceedings of Knowledge and Systems Engineering (KSE), pages 18-25, 2012. Paper bibtex @inproceedings{ dblp2280960,
title = {Detecting Bad SNPs from Illumina BeadChips Using Jeffreys Distance},
author = {Son Hoang Nguyen and Le Sy Vinh and Si Quang Le},
author_short = {Hoang Nguyen, S. and Sy Vinh, L. and Quang Le, S.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2012},
key = {dblp2280960},
id = {dblp2280960},
biburl = {http://www.dblp.org/rec/bibtex/conf/kse/NguyenVL12},
url = {http://dx.doi.org/10.1109/KSE.2012.25},
conference = {KSE},
pages = {18-25},
text = {KSE 2012:18-25},
booktitle = {Proceedings of Knowledge and Systems Engineering (KSE)}
}
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