@ARTICLE{Hockett2015,
author={Hockett, P. and Lux, C. and Wollenhaupt, M. and Baumert, T.},
title={Maximum-information photoelectron metrology},
journal={Physical Review A - Atomic, Molecular, and Optical Physics},
year={2015},
volume={92},
number={1},
doi={10.1103/PhysRevA.92.013412},
art_number={013412},
note={cited By 6},
url={https://www.scopus.com/inward/record.uri?eid=2-s2.0-84938634665&doi=10.1103%2fPhysRevA.92.013412&partnerID=40&md5=0aea4c91551f9f3a7060e68c841fa82b},
document_type={Article},
source={Scopus},
}

{"_id":"iRQYQXZemGhfmAvGp","bibbaseid":"hockett-lux-wollenhaupt-baumert-maximuminformationphotoelectronmetrology-2015","downloads":0,"creationDate":"2016-03-02T15:16:44.820Z","title":"Maximum-information photoelectron metrology","author_short":["Hockett, P.","Lux, C.","Wollenhaupt, M.","Baumert, T."],"year":2015,"bibtype":"article","biburl":"https://bibbase.org/network/files/C43CDSxgShcj9knrY","bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Hockett"],"firstnames":["P."],"suffixes":[]},{"propositions":[],"lastnames":["Lux"],"firstnames":["C."],"suffixes":[]},{"propositions":[],"lastnames":["Wollenhaupt"],"firstnames":["M."],"suffixes":[]},{"propositions":[],"lastnames":["Baumert"],"firstnames":["T."],"suffixes":[]}],"title":"Maximum-information photoelectron metrology","journal":"Physical Review A - Atomic, Molecular, and Optical Physics","year":"2015","volume":"92","number":"1","doi":"10.1103/PhysRevA.92.013412","art_number":"013412","note":"cited By 6","url":"https://www.scopus.com/inward/record.uri?eid=2-s2.0-84938634665&doi=10.1103%2fPhysRevA.92.013412&partnerID=40&md5=0aea4c91551f9f3a7060e68c841fa82b","document_type":"Article","source":"Scopus","bibtex":"@ARTICLE{Hockett2015,\nauthor={Hockett, P. and Lux, C. and Wollenhaupt, M. and Baumert, T.},\ntitle={Maximum-information photoelectron metrology},\njournal={Physical Review A - Atomic, Molecular, and Optical Physics},\nyear={2015},\nvolume={92},\nnumber={1},\ndoi={10.1103/PhysRevA.92.013412},\nart_number={013412},\nnote={cited By 6},\nurl={https://www.scopus.com/inward/record.uri?eid=2-s2.0-84938634665&doi=10.1103%2fPhysRevA.92.013412&partnerID=40&md5=0aea4c91551f9f3a7060e68c841fa82b},\ndocument_type={Article},\nsource={Scopus},\n}\n\n","author_short":["Hockett, P.","Lux, C.","Wollenhaupt, M.","Baumert, T."],"key":"Hockett2015-1-1","id":"Hockett2015-1-1","bibbaseid":"hockett-lux-wollenhaupt-baumert-maximuminformationphotoelectronmetrology-2015","role":"author","urls":{"Paper":"https://www.scopus.com/inward/record.uri?eid=2-s2.0-84938634665&doi=10.1103%2fPhysRevA.92.013412&partnerID=40&md5=0aea4c91551f9f3a7060e68c841fa82b"},"metadata":{"authorlinks":{"hockett, p":"https://bibbase.org/service/mendeley/929c804b-e5d8-3f59-bf8f-9e904e082c0f"}},"downloads":0},"search_terms":["maximum","information","photoelectron","metrology","hockett","lux","wollenhaupt","baumert"],"keywords":[],"authorIDs":["aPR7dPJNHWgr2zJ6a"],"dataSources":["6KGmJxs9RrDfHzcu8","ya2CyA73rpZseyrZ8","ZeSAiiSynrZYWcdaA","74PaJ3jeYTJQFhBLi","Cyvp3egaEX9XcqyzN","YfcyZnFA2cDJDftuJ","9YtT85enAASHbgEpa","BqutdYRmHLywqGRJb","2252seNhipfTmjEBQ"]}