Maximum-information photoelectron metrology. Hockett, P., Lux, C., Wollenhaupt, M., & Baumert, T. Physical Review A, 92(1):013412, 7, 2015.
Maximum-information photoelectron metrology [link]Website  doi  bibtex   
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 author = {Hockett, Paul and Lux, Christian and Wollenhaupt, Matthias and Baumert, Thomas},
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 journal = {Physical Review A},
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}

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