Bitline PUF: Building Native Challenge-Response PUF Capability into Any SRAM. Holcomb, D. E. & Fu, K. In Batina, L. & Robshaw, M., editors, Cryptographic Hardware and Embedded Systems – CHES 2014, of Lecture Notes in Computer Science, pages 510–526. Springer Berlin Heidelberg, September, 2014. ![Bitline PUF: Building Native Challenge-Response PUF Capability into Any SRAM [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex Physical Unclonable Functions (PUFs) are specialized circuits with applications including key generation and challenge-response authentication. PUF properties such as low cost and resistance to invasive attacks make PUFs well-suited to embedded devices. Yet, given how infrequently the specialized capabilities of a PUF may be needed, the silicon area dedicated to it is largely idle. This inefficient resource usage is at odds with the cost minimization objective of embedded devices. Motivated by this inefficiency, we propose the Bitline PUF – a novel PUF that uses modified wordline drivers together with SRAM circuitry to enable challenge-response authentication. The number of challenges that can be applied to the Bitline PUF grows exponentially with the number of SRAM rows, and these challenges can be applied at any time without power cycling. This paper presents in detail the workings of the Bitline PUF, and shows that it achieves high throughput, low latency, and uniqueness across instances. Circuit simulations indicate that the Bitline PUF responses have a nominal bit-error-rate (BER) of 0.023 at 1.2 V supply and 27°C, and that BER does not exceed 0.076 when supply voltage is varied from 1.1 V to 1.3 V, or when temperature is varied from 0°C to 80°C. Because the Bitline PUF leverages existing SRAM circuitry, its area overhead is only a single flip-flop and two logic gates per row of SRAM. The combination of high performance and low cost makes the Bitline PUF a promising candidate for commercial adoption and future research.
@incollection{holcomb_bitline_2014,
series = {Lecture {Notes} in {Computer} {Science}},
title = {Bitline {PUF}: {Building} {Native} {Challenge}-{Response} {PUF} {Capability} into {Any} {SRAM}},
copyright = {©2014 Springer-Verlag Berlin Heidelberg},
isbn = {978-3-662-44708-6 978-3-662-44709-3},
shorttitle = {Bitline {PUF}},
url = {http://link.springer.com/chapter/10.1007/978-3-662-44709-3_28},
abstract = {Physical Unclonable Functions (PUFs) are specialized circuits with applications including key generation and challenge-response authentication. PUF properties such as low cost and resistance to invasive attacks make PUFs well-suited to embedded devices. Yet, given how infrequently the specialized capabilities of a PUF may be needed, the silicon area dedicated to it is largely idle. This inefficient resource usage is at odds with the cost minimization objective of embedded devices. Motivated by this inefficiency, we propose the Bitline PUF – a novel PUF that uses modified wordline drivers together with SRAM circuitry to enable challenge-response authentication. The number of challenges that can be applied to the Bitline PUF grows exponentially with the number of SRAM rows, and these challenges can be applied at any time without power cycling. This paper presents in detail the workings of the Bitline PUF, and shows that it achieves high throughput, low latency, and uniqueness across instances. Circuit simulations indicate that the Bitline PUF responses have a nominal bit-error-rate (BER) of 0.023 at 1.2 V supply and 27°C, and that BER does not exceed 0.076 when supply voltage is varied from 1.1 V to 1.3 V, or when temperature is varied from 0°C to 80°C. Because the Bitline PUF leverages existing SRAM circuitry, its area overhead is only a single flip-flop and two logic gates per row of SRAM. The combination of high performance and low cost makes the Bitline PUF a promising candidate for commercial adoption and future research.},
language = {en},
number = {8731},
urldate = {2016-05-24TZ},
booktitle = {Cryptographic {Hardware} and {Embedded} {Systems} – {CHES} 2014},
publisher = {Springer Berlin Heidelberg},
author = {Holcomb, Daniel E. and Fu, Kevin},
editor = {Batina, Lejla and Robshaw, Matthew},
month = sep,
year = {2014},
doi = {10.1007/978-3-662-44709-3_28},
pages = {510--526}
}
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This inefficient resource usage is at odds with the cost minimization objective of embedded devices. Motivated by this inefficiency, we propose the Bitline PUF – a novel PUF that uses modified wordline drivers together with SRAM circuitry to enable challenge-response authentication. The number of challenges that can be applied to the Bitline PUF grows exponentially with the number of SRAM rows, and these challenges can be applied at any time without power cycling. This paper presents in detail the workings of the Bitline PUF, and shows that it achieves high throughput, low latency, and uniqueness across instances. Circuit simulations indicate that the Bitline PUF responses have a nominal bit-error-rate (BER) of 0.023 at 1.2 V supply and 27°C, and that BER does not exceed 0.076 when supply voltage is varied from 1.1 V to 1.3 V, or when temperature is varied from 0°C to 80°C. 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