Formal Analysis of Empirical Traces in Incident Management. Hoogendoorn, M., Jonker, C. M., Konur, S., van Maanen, P., Popova, V., Sharpanskykh, A., Treur, J., Xu, L., & Yolum, P. In Macintosh, A., Ellis, R., & Allen, T., editors, Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the Twenty-fourth SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence, Cambridge, UK, 13-15 December 2004, pages 237–250, 2004. Springer.
Formal Analysis of Empirical Traces in Incident Management [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/sgai/HoogendoornJKMP04,
  author       = {Mark Hoogendoorn and
                  Catholijn M. Jonker and
                  Savas Konur and
                  Peter{-}Paul van Maanen and
                  Viara Popova and
                  Alexei Sharpanskykh and
                  Jan Treur and
                  Lai Xu and
                  Pinar Yolum},
  editor       = {Ann Macintosh and
                  Richard Ellis and
                  Tony Allen},
  title        = {Formal Analysis of Empirical Traces in Incident Management},
  booktitle    = {Applications and Innovations in Intelligent Systems XII, Proceedings
                  of AI-2004, the Twenty-fourth {SGAI} International Conference on Innovative
                  Techniques and Applications of Artificial Intelligence, Cambridge,
                  UK, 13-15 December 2004},
  pages        = {237--250},
  publisher    = {Springer},
  year         = {2004},
  url          = {https://doi.org/10.1007/1-84628-103-2\_17},
  doi          = {10.1007/1-84628-103-2\_17},
  timestamp    = {Fri, 03 Dec 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/sgai/HoogendoornJKMP04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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