Dark-Field Electron Holography for Measuring Strain at the Nanoscale. Hÿtch, M. J., Houdellier, F., Lubk, A., Reboh, S., Javon, E., Benzo, P., Cours, R., Cherkashin, N., Gatel, C., & Snoeck, E.
bibtex   
@article{hytch_dark-field_nodate,
	title = {Dark-{Field} {Electron} {Holography} for {Measuring} {Strain} at the {Nanoscale}},
	author = {Hÿtch, M. J. and Houdellier, F. and Lubk, A. and Reboh, S. and Javon, E. and Benzo, P. and Cours, R. and Cherkashin, N. and Gatel, C. and Snoeck, E.},
}

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