Discriminative deep metric learning for face verification in the wild. Hu, J., Lu, J., & Tan, Y. In Proc. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pages 1875--1882, Greater Columbus Convention Center in Columbus, Ohio, June, 2014. bibtex @Inproceedings{Hu_2014_15539,
author = {Hu, Junlin and Lu, Jiwen and Tan, Yap-Peng},
address = { Greater Columbus Convention Center in Columbus, Ohio},
booktitle = {Proc. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition},
month = {June},
pages = {1875--1882},
title = {Discriminative deep metric learning for face verification in the wild},
year = {2014},
title_with_no_special_chars = {Discriminative deep metric learning for face verification in the wild}
}
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