Simultaneous information flow security and circuit redundancy in Boolean gates. Hu, W., Oberg, J., Mu, D., & Kastner, R. In ICCAD, pages 585-590, 2012. ACM.
Simultaneous information flow security and circuit redundancy in Boolean gates. [link]Link  Simultaneous information flow security and circuit redundancy in Boolean gates. [link]Paper  bibtex   
@inproceedings{conf/iccad/HuOMK12,
  added-at = {2015-04-30T00:00:00.000+0200},
  author = {Hu, Wei and Oberg, Jason and Mu, Dejun and Kastner, Ryan},
  biburl = {http://www.bibsonomy.org/bibtex/20fed171200239e6514320b057ae6df2e/dblp},
  booktitle = {ICCAD},
  crossref = {conf/iccad/2012},
  editor = {Hu, Alan J.},
  ee = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6386731},
  interhash = {85ce8e2387821403ae56f2d00b3430aa},
  intrahash = {0fed171200239e6514320b057ae6df2e},
  isbn = {978-1-4577-1398-9},
  keywords = {dblp},
  pages = {585-590},
  publisher = {ACM},
  timestamp = {2015-06-18T23:14:25.000+0200},
  title = {Simultaneous information flow security and circuit redundancy in Boolean gates.},
  url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2012.html#HuOMK12},
  year = 2012
}

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