Test-time adaptation improves inverse problem solving with patch-based diffusion models. Hu, J., Song, B., Fessler, J. A., & Shen, L. IEEE Trans. Computational Imaging, 11:980–91, July, 2025.
doi  bibtex   
@ARTICLE{hu:25:tta,
 author = {J. Hu and B. Song and J. A. Fessler and L. Shen},
 title = {Test-time adaptation improves inverse problem solving with patch-based diffusion models},
 journal = {{IEEE Trans. Computational Imaging}},
 volume = 11,
 pages = {{980--91}},
 month = jul,
 doi = {10.1109/TCI.2025.3587407},
 year = 2025
}

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