@article{ ISI:000332278800012,
Author = {Huang, Mengchen and Bi, Feng and Ryu, Sangwoo and Eom, Chang-Beom and
   Irvin, Patrick and Levy, Jeremy},
Title = {{Direct imaging of LaAlO3/SrTiO3 nanostructures using piezoresponse force
   microscopy}},
Journal = {{APL MATERIALS}},
Year = {{2013}},
Volume = {{1}},
Number = {{5}},
Month = {{NOV}},
Abstract = {{The interface between LaAlO3 and TiO2-terminated SrTiO3 can be switched
   between metastable conductive and insulating states using a conductive
   atomic force microscope probe. Determination of the nanoscale dimensions
   has previously required a destructive readout (e.g., local restoration
   of an insulating state). Here it is shown that high-resolution
   non-destructive imaging of conductive nanostructures can be achieved
   using a specific piezoresponse force microscopy (PFM) technique. Images
   of conductive and insulating nanoscale features are achieved with
   feature sizes as small as 30 nm. The measured nanowire width from PFM is
   well correlated with those obtained from nanowire erasure. (C) 2013
   Author(s). All article content, except where otherwise noted, is
   licensed under a Creative Commons Attribution 3.0 Unported License.}},
DOI = {{10.1063/1.4831855}},
Article-Number = {{052110}},
ISSN = {{2166-532X}},
ResearcherID-Numbers = {{Bi, Feng/J-7459-2015
   Levy, Jeremy/A-2081-2009
   Irvin, Patrick/E-2159-2012
   Eom, Chang-Beom/I-5567-2014}},
ORCID-Numbers = {{Bi, Feng/0000-0002-1604-7108
   Levy, Jeremy/0000-0002-5700-2977
   Irvin, Patrick/0000-0002-0248-2758
   }},
Unique-ID = {{ISI:000332278800012}},
}

{"_id":"YWKXv4EhiryRdcBn8","bibbaseid":"huang-bi-ryu-eom-irvin-levy-directimagingoflaalo3srtio3nanostructuresusingpiezoresponseforcemicroscopy-2013","downloads":0,"creationDate":"2018-09-17T23:43:09.227Z","title":"Direct imaging of LaAlO3/SrTiO3 nanostructures using piezoresponse force microscopy","author_short":["Huang, M.","Bi, F.","Ryu, S.","Eom, C.","Irvin, P.","Levy, J."],"year":2013,"bibtype":"article","biburl":"http://oxide.engr.wisc.edu/newWebsite/papers/oxide.bib","bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Huang"],"firstnames":["Mengchen"],"suffixes":[]},{"propositions":[],"lastnames":["Bi"],"firstnames":["Feng"],"suffixes":[]},{"propositions":[],"lastnames":["Ryu"],"firstnames":["Sangwoo"],"suffixes":[]},{"propositions":[],"lastnames":["Eom"],"firstnames":["Chang-Beom"],"suffixes":[]},{"propositions":[],"lastnames":["Irvin"],"firstnames":["Patrick"],"suffixes":[]},{"propositions":[],"lastnames":["Levy"],"firstnames":["Jeremy"],"suffixes":[]}],"title":"Direct imaging of LaAlO3/SrTiO3 nanostructures using piezoresponse force microscopy","journal":"APL MATERIALS","year":"2013","volume":"1","number":"5","month":"NOV","abstract":"The interface between LaAlO3 and TiO2-terminated SrTiO3 can be switched between metastable conductive and insulating states using a conductive atomic force microscope probe. Determination of the nanoscale dimensions has previously required a destructive readout (e.g., local restoration of an insulating state). Here it is shown that high-resolution non-destructive imaging of conductive nanostructures can be achieved using a specific piezoresponse force microscopy (PFM) technique. Images of conductive and insulating nanoscale features are achieved with feature sizes as small as 30 nm. The measured nanowire width from PFM is well correlated with those obtained from nanowire erasure. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.","doi":"10.1063/1.4831855","article-number":"052110","issn":"2166-532X","researcherid-numbers":"Bi, Feng/J-7459-2015 Levy, Jeremy/A-2081-2009 Irvin, Patrick/E-2159-2012 Eom, Chang-Beom/I-5567-2014","orcid-numbers":"Bi, Feng/0000-0002-1604-7108 Levy, Jeremy/0000-0002-5700-2977 Irvin, Patrick/0000-0002-0248-2758 ","unique-id":"ISI:000332278800012","bibtex":"@article{ ISI:000332278800012,\nAuthor = {Huang, Mengchen and Bi, Feng and Ryu, Sangwoo and Eom, Chang-Beom and\n Irvin, Patrick and Levy, Jeremy},\nTitle = {{Direct imaging of LaAlO3/SrTiO3 nanostructures using piezoresponse force\n microscopy}},\nJournal = {{APL MATERIALS}},\nYear = {{2013}},\nVolume = {{1}},\nNumber = {{5}},\nMonth = {{NOV}},\nAbstract = {{The interface between LaAlO3 and TiO2-terminated SrTiO3 can be switched\n between metastable conductive and insulating states using a conductive\n atomic force microscope probe. Determination of the nanoscale dimensions\n has previously required a destructive readout (e.g., local restoration\n of an insulating state). Here it is shown that high-resolution\n non-destructive imaging of conductive nanostructures can be achieved\n using a specific piezoresponse force microscopy (PFM) technique. Images\n of conductive and insulating nanoscale features are achieved with\n feature sizes as small as 30 nm. The measured nanowire width from PFM is\n well correlated with those obtained from nanowire erasure. (C) 2013\n Author(s). All article content, except where otherwise noted, is\n licensed under a Creative Commons Attribution 3.0 Unported License.}},\nDOI = {{10.1063/1.4831855}},\nArticle-Number = {{052110}},\nISSN = {{2166-532X}},\nResearcherID-Numbers = {{Bi, Feng/J-7459-2015\n Levy, Jeremy/A-2081-2009\n Irvin, Patrick/E-2159-2012\n Eom, Chang-Beom/I-5567-2014}},\nORCID-Numbers = {{Bi, Feng/0000-0002-1604-7108\n Levy, Jeremy/0000-0002-5700-2977\n Irvin, Patrick/0000-0002-0248-2758\n }},\nUnique-ID = {{ISI:000332278800012}},\n}\n\n","author_short":["Huang, M.","Bi, F.","Ryu, S.","Eom, C.","Irvin, P.","Levy, J."],"key":"ISI:000332278800012","id":"ISI:000332278800012","bibbaseid":"huang-bi-ryu-eom-irvin-levy-directimagingoflaalo3srtio3nanostructuresusingpiezoresponseforcemicroscopy-2013","role":"author","urls":{},"downloads":0,"html":""},"search_terms":["direct","imaging","laalo3","srtio3","nanostructures","using","piezoresponse","force","microscopy","huang","bi","ryu","eom","irvin","levy"],"keywords":[],"authorIDs":["5ba03c0cebfd3910000001e0"],"dataSources":["zArY7xMz8KdDswhhx"]}