Learning euclidean-to-riemannian metric for point-to-set classification. Huang, Z., Wang, R., Shan, S., & Chen, X. In Proc. IEEE Conference on Computer Vision and Pattern Recognition, pages 1-8, Columbus, OH, Jun. 24-27, 2014.
bibtex   
@Inproceedings{Huang_2014_15447,
  author = {Huang, Z. and Wang, R. and Shan, S. and Chen, X.},
 address = {Columbus, OH},
 booktitle = {Proc. IEEE Conference on Computer Vision and Pattern Recognition},
 month = {Jun. 24-27},
 pages = {1-8},
 title = {Learning euclidean-to-riemannian metric for point-to-set classification},
 year = {2014},
 snippets = {CVPR14},
 title_with_no_special_chars = {Learning EuclideantoRiemannian Metric for PointtoSet Classification}
}

Downloads: 0