AFM Measurements of Novel Solar Cells

AFM Measurements of Novel Solar Cells. Hývl, M. G.I.T. Imaging \& Microscopy, 2014(1):52--53, 2014. 00000

In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction solar cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.

@article{ hyvl_afm_2014,
  title = {{AFM} Measurements of Novel Solar Cells},
  volume = {2014},
  shorttitle = {I\&M},
  url = {http://www.imaging-git.com/tags/matej-hyvl},
  abstract = {In this paper, we demonstrate the use of atomic force microscopy ({AFM}) with a conductive cantilever to study local electronic properties of silicon
nanostructures:
p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction
solar
cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.},
  number = {1},
  urldate = {2014-05-12TZ},
  journal = {G.I.T. Imaging \& Microscopy},
  author = {Hývl, Matěj},
  year = {2014},
  note = {00000},
  pages = {52--53}
}

Downloads: 0

{"_id":"N6fiMKuZSXjtEY2bR","authorIDs":[],"author_short":["Hývl, M."],"bibbaseid":"hvl-afmmeasurementsofnovelsolarcells-2014","bibdata":{"abstract":"In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction solar cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.","author":["Hývl, Matěj"],"author_short":["Hývl, M."],"bibtex":"@article{ hyvl_afm_2014,\n title = {{AFM} Measurements of Novel Solar Cells},\n volume = {2014},\n shorttitle = {I\\&M},\n url = {http://www.imaging-git.com/tags/matej-hyvl},\n abstract = {In this paper, we demonstrate the use of atomic force microscopy ({AFM}) with a conductive cantilever to study local electronic properties of silicon\nnanostructures:\np-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction\nsolar\ncells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.},\n number = {1},\n urldate = {2014-05-12TZ},\n journal = {G.I.T. Imaging \\& Microscopy},\n author = {Hývl, Matěj},\n year = {2014},\n note = {00000},\n pages = {52--53}\n}","bibtype":"article","id":"hyvl_afm_2014","journal":"G.I.T. Imaging \\& Microscopy","key":"hyvl_afm_2014","note":"00000","number":"1","pages":"52--53","shorttitle":"I\\&M","title":"AFM Measurements of Novel Solar Cells","type":"article","url":"http://www.imaging-git.com/tags/matej-hyvl","urldate":"2014-05-12TZ","volume":"2014","year":"2014","bibbaseid":"hvl-afmmeasurementsofnovelsolarcells-2014","role":"author","urls":{"Paper":"http://www.imaging-git.com/tags/matej-hyvl"},"downloads":0},"bibtype":"article","biburl":"https://api.zotero.org/users/9306/collections/JFDUGS8I/items?key=21TnaZbJCCSlizSwnZvqCpTA&format=bibtex&limit=100","creationDate":"2015-02-03T19:54:44.473Z","downloads":0,"keywords":[],"search_terms":["afm","measurements","novel","solar","cells","hývl"],"title":"AFM Measurements of Novel Solar Cells","year":2014,"dataSources":["uzFNqJfGLurttqrQk"]}