AFM Measurements of Novel Solar Cells. Hývl, M. G.I.T. Imaging \& Microscopy, 2014(1):52--53, 2014. 00000
AFM Measurements of Novel Solar Cells [link]Paper  abstract   bibtex   
In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction solar cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.
@article{ hyvl_afm_2014,
  title = {{AFM} Measurements of Novel Solar Cells},
  volume = {2014},
  shorttitle = {I\&M},
  url = {http://www.imaging-git.com/tags/matej-hyvl},
  abstract = {In this paper, we demonstrate the use of atomic force microscopy ({AFM}) with a conductive cantilever to study local electronic properties of silicon
nanostructures:
p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction
solar
cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.},
  number = {1},
  urldate = {2014-05-12TZ},
  journal = {G.I.T. Imaging \& Microscopy},
  author = {Hývl, Matěj},
  year = {2014},
  note = {00000},
  pages = {52--53}
}

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