@article{iwatsuki_scanning_1991,
	title = {Scanning {Tunneling} {Microscope} ({STM}) for {Conventional} {Transmission} {Electron} {Microscope} ({TEM})},
	volume = {40},
	issn = {0022-0744, 1477-9986},
	url = {http://jmicro.oxfordjournals.org/content/40/1/48},
	abstract = {In order to identify an observation area with a scanning tunneling microscope (STM) and a particular area of the specimen, we developed a holder-type STM for an ultrahigh vacuum transmission electron microscope (UHV-TEM), operating in a reflection electron microscopy mode (REM). This instrument has been improved in the dynamic range of the observation area and the piezoelectric scanner provides a high mechanical resonance frequency of 160 kHz.},
	language = {en},
	number = {1},
	urldate = {2012-08-31},
	journal = {Journal of Electron Microscopy},
	author = {Iwatsuki, Masashi and Murooka, Kenichi and Kitamura, Shin-ichi and Takayanagi, Kunio and Harada, Yoshiyasu},
	month = feb,
	year = {1991},
	keywords = {REM, STM-REM holder, UHU-TEM, piezoelectric scanner, scanning tunneling microscope (STM)},
	pages = {48--53},
}

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