Mining the relationship between anti-patterns dependencies and fault-proneness. Jaafar, F., Guéhéneuc, Y., Hamel, S., & Khomh, F. In Lämmel, R., Oliveto, R., & Robbes, R., editors, WCRE, pages 351-360, 2013. IEEE Computer Society.
Mining the relationship between anti-patterns dependencies and fault-proneness. [link]Link  Mining the relationship between anti-patterns dependencies and fault-proneness. [link]Paper  bibtex   
@inproceedings{conf/wcre/JaafarGHK13,
  added-at = {2023-03-24T00:00:00.000+0100},
  author = {Jaafar, Fehmi and Guéhéneuc, Yann-Gaël and Hamel, Sylvie and Khomh, Foutse},
  biburl = {https://www.bibsonomy.org/bibtex/24e317f89e6e1be3b3b2a9835a77da373/dblp},
  booktitle = {WCRE},
  crossref = {conf/wcre/2013},
  editor = {Lämmel, Ralf and Oliveto, Rocco and Robbes, Romain},
  ee = {https://www.wikidata.org/entity/Q60704245},
  interhash = {d56d474377b2c95fad43cfb44a97770c},
  intrahash = {4e317f89e6e1be3b3b2a9835a77da373},
  isbn = {978-1-4799-2931-3},
  keywords = {dblp},
  pages = {351-360},
  publisher = {IEEE Computer Society},
  timestamp = {2024-04-10T12:37:39.000+0200},
  title = {Mining the relationship between anti-patterns dependencies and fault-proneness.},
  url = {http://dblp.uni-trier.de/db/conf/wcre/wcre2013.html#JaafarGHK13},
  year = 2013
}

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