VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO

VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO. Jamil, A., Ziegler, T., Hufschmidt, P., Li, G., Lupin-Jimenez, L., Michel, T., Ostrovskiy, I., Retiere, F., Schneider, J., Wagenpfeil, M., Alamre, A., Albert, J. B., Anton, G., Arnquist, I. J., Badhrees, I., Barbeau, P. S., Beck, D., Belov, V., Bhatta, T., Bourque, F., Brodsky, J. P., Brown, E., Brunner, T., Burenkov, A., Cao, G. F., Cao, L., Cen, W. R., Chambers, C., Charlebois, S. A., Chiu, M., Cleveland, B., Coon, M., Cote, M., Craycraft, A., Cree, W., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S. J., Daughhetee, J., Delaquis, S., Mesrobian-Kabakian, A. D., DeVoe, R., Dilling, J., Ding, Y. Y., Dolinski, M. J., Dragone, A., Echevers, J., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Feyzbakhsh, S., Fontaine, R., Fudenberg, D., Gallina, G., Giacomini, G., Gornea, R., Gratta, G., Hansen, E. V., Harris, D., Hasan, M., Heffner, M., HoBl, J., Hoppe, E. W., House, A., Hughes, M., Ito, Y., Iverson, A., Jessiman, C., Jewell, M. J., Jiang, X. S., Karelin, A., Kaufman, L. J., Koffas, T., Kravitz, S., Krucken, R., Kuchenkov, A., Kumar, K. S., Lan, Y., Larson, A., Leonard, D. S., Li, S., Li, Z., Licciardi, C., Lin, Y. H., Lv, P., MacLellan, R., Mong, B., Moore, D. C., Murray, K., Newby, R. J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J. L., Ortega, G. S., Overman, C. T., Parent, S., Piepke, A., Pocar, A., Pratte, J., Qiu, D., Radeka, V., Raguzin, E., Rao, T., Rescia, S., Robinson, A., Rossignol, T., Rowson, P. C., Roy, N., Saldanha, R., Sangiorgio, S., Schmidt, S., Schubert, A., Sinclair, D., Skarpaas, K., Soma, A. K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X. L., Tarka, M., Todd, J., Tolba, T., Totev, T. I., Tsang, R., Tsang, T., Vachon, F., Veenstra, B., Veeraraghavan, V., Visser, G., Vuilleumier, J., Wang, Q., Watkins, J., Weber, M., Wei, W., Wen, L. J., Wichoski, U., Wrede, G., Wu, S. X., Wu, W. H., Xia, Q., Yang, L., Yen, Y., Zeldovich, O., Zhang, X., Zhao, J., & Zhou, Y. IEEE Transactions on Nuclear Science, 65(11):2823–2833, November, 2018.

Paper doi bibtex

@article{jamil_vuv-sensitive_2018,
	title = {{VUV}-{Sensitive} {Silicon} {Photomultipliers} for {Xenon} {Scintillation} {Light} {Detection} in {nEXO}},
	volume = {65},
	issn = {0018-9499, 1558-1578},
	url = {https://ieeexplore.ieee.org/document/8490731/},
	doi = {10.1109/TNS.2018.2875668},
	number = {11},
	urldate = {2022-03-18},
	journal = {IEEE Transactions on Nuclear Science},
	author = {Jamil, A. and Ziegler, T. and Hufschmidt, P. and Li, G. and Lupin-Jimenez, L. and Michel, T. and Ostrovskiy, I. and Retiere, F. and Schneider, J. and Wagenpfeil, M. and Alamre, A. and Albert, J. B. and Anton, G. and Arnquist, I. J. and Badhrees, I. and Barbeau, P. S. and Beck, D. and Belov, V. and Bhatta, T. and Bourque, F. and Brodsky, J. P. and Brown, E. and Brunner, T. and Burenkov, A. and Cao, G. F. and Cao, L. and Cen, W. R. and Chambers, C. and Charlebois, S. A. and Chiu, M. and Cleveland, B. and Coon, M. and Cote, M. and Craycraft, A. and Cree, W. and Dalmasson, J. and Daniels, T. and Darroch, L. and Daugherty, S. J. and Daughhetee, J. and Delaquis, S. and Mesrobian-Kabakian, A. Der and DeVoe, R. and Dilling, J. and Ding, Y. Y. and Dolinski, M. J. and Dragone, A. and Echevers, J. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Feyzbakhsh, S. and Fontaine, R. and Fudenberg, D. and Gallina, G. and Giacomini, G. and Gornea, R. and Gratta, G. and Hansen, E. V. and Harris, D. and Hasan, M. and Heffner, M. and HoBl, J. and Hoppe, E. W. and House, A. and Hughes, M. and Ito, Y. and Iverson, A. and Jessiman, C. and Jewell, M. J. and Jiang, X. S. and Karelin, A. and Kaufman, L. J. and Koffas, T. and Kravitz, S. and Krucken, R. and Kuchenkov, A. and Kumar, K. S. and Lan, Y. and Larson, A. and Leonard, D. S. and Li, S. and Li, Z. and Licciardi, C. and Lin, Y. H. and Lv, P. and MacLellan, R. and Mong, B. and Moore, D. C. and Murray, K. and Newby, R. J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Odian, A. and Oriunno, M. and Orrell, J. L. and Ortega, G. S. and Overman, C. T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J.-F. and Qiu, D. and Radeka, V. and Raguzin, E. and Rao, T. and Rescia, S. and Robinson, A. and Rossignol, T. and Rowson, P. C. and Roy, N. and Saldanha, R. and Sangiorgio, S. and Schmidt, S. and Schubert, A. and Sinclair, D. and Skarpaas, K. and Soma, A. K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X. L. and Tarka, M. and Todd, J. and Tolba, T. and Totev, T. I. and Tsang, R. and Tsang, T. and Vachon, F. and Veenstra, B. and Veeraraghavan, V. and Visser, G. and Vuilleumier, J.-L. and Wang, Q. and Watkins, J. and Weber, M. and Wei, W. and Wen, L. J. and Wichoski, U. and Wrede, G. and Wu, S. X. and Wu, W. H. and Xia, Q. and Yang, L. and Yen, Y.-R. and Zeldovich, O. and Zhang, X. and Zhao, J. and Zhou, Y.},
	month = nov,
	year = {2018},
	keywords = {Instrumentation, SIPMs, nEXO},
	pages = {2823--2833},
}

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