@article{ ISI:000258975100062,
Author = {Jang, H. W. and Baek, S. H. and Ortiz, D. and Folkman, C. M. and Das, R.
   R. and Chu, Y. H. and Shafer, P. and Zhang, J. X. and Choudhury, S. and
   Vaithyanathan, V. and Chen, Y. B. and Felker, D. A. and Biegalski, M. D.
   and Rzchowski, M. S. and Pan, X. Q. and Schlom, D. G. and Chen, L. Q.
   and Ramesh, R. and Eom, C. B.},
Title = {{Strain-induced polarization rotation in epitaxial (001) BiFeO(3) thin
   films}},
Journal = {{PHYSICAL REVIEW LETTERS}},
Year = {{2008}},
Volume = {{101}},
Number = {{10}},
Month = {{SEP 5}},
Abstract = {{Direct measurement of the remanent polarization of high quality
   (001)-oriented epitaxial BiFeO(3) thin films shows a strong strain
   dependence, even larger than conventional (001)-oriented PbTiO(3) films.
   Thermodynamic analysis reveals that a strain-induced polarization
   rotation mechanism is responsible for the large change in the
   out-of-plane polarization of (001) BiFeO(3) with biaxial strain while
   the spontaneous polarization itself remains almost constant.}},
DOI = {{10.1103/PhysRevLett.101.107602}},
Article-Number = {{107602}},
ISSN = {{0031-9007}},
ResearcherID-Numbers = {{Jang, Ho Won/D-9866-2011
   Choudhury, Samrat/B-4115-2009
   Ying-Hao, Chu/A-4204-2008
   Chen, LongQing/I-7536-2012
   Schlom, Darrell/J-2412-2013
   Eom, Chang-Beom/I-5567-2014
   Baek, Seung-Hyub/B-9189-2013
   Zhang, Jingxian/B-2253-2010
   }},
ORCID-Numbers = {{Jang, Ho Won/0000-0002-6952-7359
   Ying-Hao, Chu/0000-0002-3435-9084
   Chen, LongQing/0000-0003-3359-3781
   Schlom, Darrell/0000-0003-2493-6113
   Shafer, Padraic/0000-0001-9363-2557}},
Unique-ID = {{ISI:000258975100062}},
}

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B."],"year":2008,"bibtype":"article","biburl":"http://oxide.engr.wisc.edu/newWebsite/papers/oxide.bib","bibdata":{"bibtype":"article","type":"article","author":[{"propositions":[],"lastnames":["Jang"],"firstnames":["H.","W."],"suffixes":[]},{"propositions":[],"lastnames":["Baek"],"firstnames":["S.","H."],"suffixes":[]},{"propositions":[],"lastnames":["Ortiz"],"firstnames":["D."],"suffixes":[]},{"propositions":[],"lastnames":["Folkman"],"firstnames":["C.","M."],"suffixes":[]},{"propositions":[],"lastnames":["Das"],"firstnames":["R.","R."],"suffixes":[]},{"propositions":[],"lastnames":["Chu"],"firstnames":["Y.","H."],"suffixes":[]},{"propositions":[],"lastnames":["Shafer"],"firstnames":["P."],"suffixes":[]},{"propositions":[],"lastnames":["Zhang"],"firstnames":["J.","X."],"suffixes":[]},{"propositions":[],"lastnames":["Choudhury"],"firstnames":["S."],"suffixes":[]},{"propositions":[],"lastnames":["Vaithyanathan"],"firstnames":["V."],"suffixes":[]},{"propositions":[],"lastnames":["Chen"],"firstnames":["Y.","B."],"suffixes":[]},{"propositions":[],"lastnames":["Felker"],"firstnames":["D.","A."],"suffixes":[]},{"propositions":[],"lastnames":["Biegalski"],"firstnames":["M.","D."],"suffixes":[]},{"propositions":[],"lastnames":["Rzchowski"],"firstnames":["M.","S."],"suffixes":[]},{"propositions":[],"lastnames":["Pan"],"firstnames":["X.","Q."],"suffixes":[]},{"propositions":[],"lastnames":["Schlom"],"firstnames":["D.","G."],"suffixes":[]},{"propositions":[],"lastnames":["Chen"],"firstnames":["L.","Q."],"suffixes":[]},{"propositions":[],"lastnames":["Ramesh"],"firstnames":["R."],"suffixes":[]},{"propositions":[],"lastnames":["Eom"],"firstnames":["C.","B."],"suffixes":[]}],"title":"Strain-induced polarization rotation in epitaxial (001) BiFeO(3) thin films","journal":"PHYSICAL REVIEW LETTERS","year":"2008","volume":"101","number":"10","month":"SEP 5","abstract":"Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO(3) thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO(3) films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO(3) with biaxial strain while the spontaneous polarization itself remains almost constant.","doi":"10.1103/PhysRevLett.101.107602","article-number":"107602","issn":"0031-9007","researcherid-numbers":"Jang, Ho Won/D-9866-2011 Choudhury, Samrat/B-4115-2009 Ying-Hao, Chu/A-4204-2008 Chen, LongQing/I-7536-2012 Schlom, Darrell/J-2412-2013 Eom, Chang-Beom/I-5567-2014 Baek, Seung-Hyub/B-9189-2013 Zhang, Jingxian/B-2253-2010 ","orcid-numbers":"Jang, Ho Won/0000-0002-6952-7359 Ying-Hao, Chu/0000-0002-3435-9084 Chen, LongQing/0000-0003-3359-3781 Schlom, Darrell/0000-0003-2493-6113 Shafer, Padraic/0000-0001-9363-2557","unique-id":"ISI:000258975100062","bibtex":"@article{ ISI:000258975100062,\nAuthor = {Jang, H. W. and Baek, S. H. and Ortiz, D. and Folkman, C. M. and Das, R.\n R. and Chu, Y. H. and Shafer, P. and Zhang, J. X. and Choudhury, S. and\n Vaithyanathan, V. and Chen, Y. B. and Felker, D. A. and Biegalski, M. D.\n and Rzchowski, M. S. and Pan, X. Q. and Schlom, D. G. and Chen, L. Q.\n and Ramesh, R. and Eom, C. B.},\nTitle = {{Strain-induced polarization rotation in epitaxial (001) BiFeO(3) thin\n films}},\nJournal = {{PHYSICAL REVIEW LETTERS}},\nYear = {{2008}},\nVolume = {{101}},\nNumber = {{10}},\nMonth = {{SEP 5}},\nAbstract = {{Direct measurement of the remanent polarization of high quality\n (001)-oriented epitaxial BiFeO(3) thin films shows a strong strain\n dependence, even larger than conventional (001)-oriented PbTiO(3) films.\n Thermodynamic analysis reveals that a strain-induced polarization\n rotation mechanism is responsible for the large change in the\n out-of-plane polarization of (001) BiFeO(3) with biaxial strain while\n the spontaneous polarization itself remains almost constant.}},\nDOI = {{10.1103/PhysRevLett.101.107602}},\nArticle-Number = {{107602}},\nISSN = {{0031-9007}},\nResearcherID-Numbers = {{Jang, Ho Won/D-9866-2011\n Choudhury, Samrat/B-4115-2009\n Ying-Hao, Chu/A-4204-2008\n Chen, LongQing/I-7536-2012\n Schlom, Darrell/J-2412-2013\n Eom, Chang-Beom/I-5567-2014\n Baek, Seung-Hyub/B-9189-2013\n Zhang, Jingxian/B-2253-2010\n }},\nORCID-Numbers = {{Jang, Ho Won/0000-0002-6952-7359\n Ying-Hao, Chu/0000-0002-3435-9084\n Chen, LongQing/0000-0003-3359-3781\n Schlom, Darrell/0000-0003-2493-6113\n Shafer, Padraic/0000-0001-9363-2557}},\nUnique-ID = {{ISI:000258975100062}},\n}\n\n","author_short":["Jang, H. 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