Dynamical effects in strain measurements by dark-field electron holography. Javon, E., Lubk, A., Cours, R., Reboh, S., Cherkashin, N., Houdellier, F., Gatel, C., & Hÿtch, M. J. Ultramicroscopy, 147:70–85, 2014.
bibtex   
@article{javon_dynamical_2014,
	title = {Dynamical effects in strain measurements by dark-field electron holography},
	volume = {147},
	journal = {Ultramicroscopy},
	author = {Javon, Elsa and Lubk, Axel and Cours, Robin and Reboh, Shay and Cherkashin, Nikolay and Houdellier, Florent and Gatel, Christophe and Hÿtch, M. J.},
	year = {2014},
	pages = {70--85},
}

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