On the Application of Systematic t-way Software Testing for Safety Critical Embedded Digital Devices in Nuclear Power. Jayakumar, A., Gautham, S., Kuhn, R., Simons, B., Collins, A., Dirsch, T., Kacker, R., & Elks, C. submitted to The 31st International Symposium on Software Reliability Engineering(ISSRE), waiting decision, 2020.
bibtex   
@article{jayakumar_application_2020,
	title = {On the {Application} of {Systematic} t-way {Software} {Testing} for {Safety} {Critical} {Embedded} {Digital} {Devices} in {Nuclear} {Power}},
	journal = {submitted to The 31st International Symposium on Software Reliability Engineering(ISSRE), waiting decision},
	author = {Jayakumar, Athira and Gautham, Smitha and Kuhn, Richard and Simons, Brandon and Collins, Aidan and Dirsch, Thomas and Kacker, Raghu and Elks, Carl},
	year = {2020},
}

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