Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor. Jeffrey, C., Xu, Z., & Richardson, A. In ETS, pages 88-93, 2005. IEEE Computer Society.
Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor. [link]Link  Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor. [link]Paper  bibtex   
@inproceedings{conf/ets/JeffreyXR05,
  added-at = {2023-03-23T00:00:00.000+0100},
  author = {Jeffrey, Carl and Xu, Zhou and Richardson, Andrew},
  biburl = {https://www.bibsonomy.org/bibtex/2ddf81e3948b403990536477e47e7bf97/dblp},
  booktitle = {ETS},
  crossref = {conf/ets/2005},
  ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2005.9},
  interhash = {b50e0aae1b8d560b7ec8aed1991542b8},
  intrahash = {ddf81e3948b403990536477e47e7bf97},
  isbn = {0-7695-2341-2},
  keywords = {dblp},
  pages = {88-93},
  publisher = {IEEE Computer Society},
  timestamp = {2024-04-10T20:47:42.000+0200},
  title = {Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor.},
  url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#JeffreyXR05},
  year = 2005
}

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