High-resolution AES analysis and imaging of In–80Sn oxidized surface using field emission auger microprobe. Jenko, M., Erjavec, B., & Milun, M. Vacuum, 71(1-2):19-25, 5, 2003.
High-resolution AES analysis and imaging of In–80Sn oxidized surface using field emission auger microprobe [link]Website  abstract   bibtex   
In this study, for the first time, it is shown how the heating of an In-80Sn alloy affects its morphology and surface chemical composition. The study of the initial phases of surface oxidation of the pure In-80Sn alloy at room temperature revealed the formation of a mixture of In2O3, SnO and SnO2 oxides with a dominant contribution of In2O3. The high spatial resolution of the Auger spectrometer enabled us to examine the fine details at various spots on the surface. The results vary from one point of analysis to another. The statistical analysis of a large number of spectra shows clearly an enrichment in the In content in both oxide layer and the clean sample obtained after the oxide layer is removed by heating the sample at 400??C. The thickness of the oxide layer, approximately 3.5nm, was estimated by AES depth profiling analysis. ?? 2003 Published by Elsevier Science Ltd.
@article{
 title = {High-resolution AES analysis and imaging of In–80Sn oxidized surface using field emission auger microprobe},
 type = {article},
 year = {2003},
 identifiers = {[object Object]},
 keywords = {Fluxless vacuum soldering,High-resolution auger electron spectroscopy,In-80Sn,Oxidation},
 pages = {19-25},
 volume = {71},
 websites = {http://linkinghub.elsevier.com/retrieve/pii/S0042207X0200708X},
 month = {5},
 day = {9},
 id = {91155c3d-0cb1-309d-876b-9ce9074623ec},
 created = {2016-12-15T10:02:51.000Z},
 file_attached = {false},
 profile_id = {12182ba0-f80b-33ff-8da5-1813b38b682d},
 group_id = {60cbc7ed-7d3c-385a-96b0-5920f1dfe2f9},
 last_modified = {2017-03-14T16:39:15.352Z},
 read = {false},
 starred = {false},
 authored = {false},
 confirmed = {true},
 hidden = {false},
 citation_key = {Jenko2003},
 private_publication = {false},
 abstract = {In this study, for the first time, it is shown how the heating of an In-80Sn alloy affects its morphology and surface chemical composition. The study of the initial phases of surface oxidation of the pure In-80Sn alloy at room temperature revealed the formation of a mixture of In2O3, SnO and SnO2 oxides with a dominant contribution of In2O3. The high spatial resolution of the Auger spectrometer enabled us to examine the fine details at various spots on the surface. The results vary from one point of analysis to another. The statistical analysis of a large number of spectra shows clearly an enrichment in the In content in both oxide layer and the clean sample obtained after the oxide layer is removed by heating the sample at 400??C. The thickness of the oxide layer, approximately 3.5nm, was estimated by AES depth profiling analysis. ?? 2003 Published by Elsevier Science Ltd.},
 bibtype = {article},
 author = {Jenko, M and Erjavec, B. and Milun, Milorad},
 journal = {Vacuum},
 number = {1-2}
}

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