Depth from a light field image with learning-based matching costs. Jeon, H., Park, J., Choe, G., Park, J., Bok, Y., Tai, Y., & Kweon, I. S. IEEE transactions on pattern analysis and machine intelligence, 41(2):297–310, IEEE, 2018. bibtex @article{jeon2018depth,
title={Depth from a light field image with learning-based matching costs},
author={Jeon, Hae-Gon and Park, Jaesik and Choe, Gyeongmin and Park, Jinsun and Bok, Yunsu and Tai, Yu-Wing and Kweon, In So},
journal={IEEE transactions on pattern analysis and machine intelligence},
volume={41},
number={2},
pages={297--310},
year={2018},
publisher={IEEE}
}
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