@inproceedings{DBLP:conf/icst/JohnsJ11,
  author    = {Martin Johns and
               Moritz Jodeit},
  title     = {Scanstud: {A} Methodology for Systematic, Fine-Grained Evaluation
               of Static Analysis Tools},
  booktitle = {Fourth {IEEE} International Conference on Software Testing, Verification
               and Validation, {ICST} 2012, Berlin, Germany, 21-25 March, 2011, Workshop
               Proceedings},
  pages     = {523--530},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://doi.org/10.1109/ICSTW.2011.32},
  doi       = {10.1109/ICSTW.2011.32},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/icst/JohnsJ11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

{"_id":"s5Lxny6kEXPNybK4G","bibbaseid":"johns-jodeit-scanstudamethodologyforsystematicfinegrainedevaluationofstaticanalysistools-2011","author_short":["Johns, M.","Jodeit, M."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","author":[{"firstnames":["Martin"],"propositions":[],"lastnames":["Johns"],"suffixes":[]},{"firstnames":["Moritz"],"propositions":[],"lastnames":["Jodeit"],"suffixes":[]}],"title":"Scanstud: A Methodology for Systematic, Fine-Grained Evaluation of Static Analysis Tools","booktitle":"Fourth IEEE International Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings","pages":"523–530","publisher":"IEEE Computer Society","year":"2011","url":"https://doi.org/10.1109/ICSTW.2011.32","doi":"10.1109/ICSTW.2011.32","timestamp":"Wed, 16 Oct 2019 14:14:54 +0200","biburl":"https://dblp.org/rec/conf/icst/JohnsJ11.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@inproceedings{DBLP:conf/icst/JohnsJ11,\n author = {Martin Johns and\n Moritz Jodeit},\n title = {Scanstud: {A} Methodology for Systematic, Fine-Grained Evaluation\n of Static Analysis Tools},\n booktitle = {Fourth {IEEE} International Conference on Software Testing, Verification\n and Validation, {ICST} 2012, Berlin, Germany, 21-25 March, 2011, Workshop\n Proceedings},\n pages = {523--530},\n publisher = {{IEEE} Computer Society},\n year = {2011},\n url = {https://doi.org/10.1109/ICSTW.2011.32},\n doi = {10.1109/ICSTW.2011.32},\n timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},\n biburl = {https://dblp.org/rec/conf/icst/JohnsJ11.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Johns, M.","Jodeit, M."],"key":"DBLP:conf/icst/JohnsJ11","id":"DBLP:conf/icst/JohnsJ11","bibbaseid":"johns-jodeit-scanstudamethodologyforsystematicfinegrainedevaluationofstaticanalysistools-2011","role":"author","urls":{"Paper":"https://doi.org/10.1109/ICSTW.2011.32"},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://dblp.org/pid/82/359.bib","dataSources":["sA5JSGkk3PZnWmqoJ","MiwiMN3nEKAt6pEbR","MTyfrGCNFuyFmBbgM","92dqjeNLAAj3Tut8G","RFjEkcmh99PiRx77M","CYDW5hnJ3L5GC8Na9"],"keywords":[],"search_terms":["scanstud","methodology","systematic","fine","grained","evaluation","static","analysis","tools","johns","jodeit"],"title":"Scanstud: A Methodology for Systematic, Fine-Grained Evaluation of Static Analysis Tools","year":2011}